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第三代

半导体测试家族

Third generation semiconductor testing family

首页产品中心 Test System IC testing system

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QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.

Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model	QT-8100
Product Advantages	The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.
Key Features	• Floating source, digital frequency 25.6MHz, vector depth 64M • 18 bit high-precision sampling • 600+ digital-analog hybrid test channels, multiple 1000V/20A high-voltage and high-current • Multi-channel high-precision time measurement unit, sustaining ns-level time measurement • Support RF module expansion • Efficient and accurate communication configuration, test efficiency further upgraded

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