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第三代

半导体测试家族

Third generation semiconductor testing family

首页产品中心 Test System IC testing system

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QT-8600RF Mixed Signal RF Test System

RF6G/12G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, and spurious test.

Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model	QT-8600RF Mixed Signal RF Test System
Product Advantages	RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
Key Features	• 6GHz/12GHz RF measurement, digital meets tests MIPI 100MHz or within • Supports vector scalar test, DC, digital, RF integrated machine • Power up to 9GHz & 35dBm, supports 2-station RF parallel test, multi-station composite test • Self-developed algorithm communication, UPH up to 12K/H • Provides efficient test platform for RF switches, LNA, TUNER, filters and other devices

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