QT-6000 Discrete Device High-Speed Test System
QT-6000 discrete device high-speed tester, suitable for testing small and medium power diodes, transistors, MOS and other products. It can expand built-in capacitance (DC+CAP), EAS, Vc, pA modules, and can also expand external LCR (ultra-high precision capacitance test), Scanbox, etc., applied for wafer, FT mass production or laboratory testing.
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Suspended power supply |
Four quadrant circuit |
High speed test |
Supports multiple extensions |
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Type |
QT-6000 |
| Advantages |
• QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability and strong anti-interference ability. • Adopting four-quadrant circuit, the device under test can be protected very well. • Adopting suspended power supply and fully symmetrical structure. • High-speed testing meets the requirements of handler above UPH56K. |
| Main Features |
• High speed test, UPH>40K • One-to-two can achieve 100% FT+QA parallel testing • Advanced capacitor high-speed test solution to achieve CAP+DC same-station testing • Built-in UIS test solution to achieve DC+UIS same-station testing • LCR precision capacitance test, the minimum test capacitance value is 100fF • Voltage/current (optional): 1200V/600V, 30A/10A/3A. |
Testing standards检测标准
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中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
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0757 83207313 (销售) |
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0757 83208786 (销售) |
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info@powertechsemi.com |
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