

第三代
半导体测试家族
Third generation semiconductor testing family
分类

QT-8409PIM high-power dynamic and static comprehensive test system
QT-8409PIM test system, applied to IGBT/SiC power modules, meets dynamic and static parameter testing
High-speed short-circuit protection |
Low stray |
Flexible tooling |
Suitable for mass production/manual test |
Type |
QT-8409PIM |
Advantages |
Industry-leading short-circuit protection speed, effectively protecting the socket; low stray; fast replacement of different packages |
Main Features |
• Support 4 (DC/AC) stations • Stray inductance LS<30nH • AC: SW, TRR, ISC, QG, RBSOA test • AC @3000A 1500V, ISC 12kA • DC @2000A 2kV/3kV/6kV/8kV • Short-circuit protection <1uS • Test objects: PIM IGBT modules, SiC modules, DBC, three-level products, etc. |
Recommend推荐产品
888贵宾会官网 版权所有 powertechsemi.com © 2015 | 隐私政策 | Sitemap 粤ICP备17127080号-1


