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第三代

半导体测试家族

Third generation semiconductor testing family

首页产品中心 Test System Power Device Testing System

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QT-3101 UIL avalanche test

QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes

Support double DIE

Fast charging

Save failure waveform

Clamp voltage function

Type	QT-3101 UIL
Advantages	Support VDD ON(E=1/2LIIBVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2LII) test Can share a computer with QT-4100B to achieve unified management of test programs and data Single pulse, multi-pulse or dual MOSFET testing can be set Real-time measurement monitors, output current, IDMAX, and Energy readouts The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter Built-in oscilloscope
Main Features	Support RPF Wafer test burst protection Visual of actual measured energy (mJ) Support PVDROOP, PVCOLLAPSE test QT-UILM module: ID current output capacity increased to 400A, BVDSS voltage measurement 5K

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